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XPS Thickness Solver
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
Citations Non-affiliated (2) | Affiliated (0)
Non-affiliated authors
- C. Rameshan, M.L. Ng, A. Shavorskiy, J.T. Newberg, H. Bluhm, (2015), "Water Adsorption On Polycrystalline Vanadium From Ultra-high Vacuum To Ambient Relative Humidity", Surface Science, 641: pg: 141-147, (DOI: 10.1016/j.susc.2015.06.004)
- Lukas Mayr, Andrea Auer, Simon Penner, Norbert Kopfle, Bernhard Kloetzer, (2013), "An ultra High-vacuum Compatible Sputter Source For Oxide Thin Film Growth", Review Of Scientific Instruments, AIP Publishing, 84, 9: pg: -, 0034-6748 (DOI: 10.1063/1.4821148)