Resistively-Detected NMR and Nuclear Resonance Imaging
07 May 2020 | | Contributor(s):: Yoshiro Hirayama
NMR provides us versatile tool to physical, chemical, biological, and medical characterizations. However, conventional NMR suffers low sensitivity and cannot be applied to semiconductor quantum systems, such as single quantum well or wire. To overcome these difficulties,...
Mystery Molecules: Identifying Materials with Nanoscale Characterization Tools
18 Mar 2020 | | Contributor(s):: Maude Cuchiara, NNCI Nano
In this lesson plan, students will be given several similar looking materials and asked to identify them by observing them at the macro and micro-scale. They will then be exposed to different analytical tools and describe how they can be used to explore materials at the nanoscale. ...
Mar 16 2020
Spring 2020 IEN Micro-Fabrication Short Course
Quantum-Enhanced Imaging for Advanced Characterization
21 Jan 2020 | | Contributor(s):: Raphael C. Pooser
Modeling Sanning Probe Microscopes (SPM)
06 Jan 2020 | | Contributor(s):: Woodward Maxwell, NNCI Nano
The Modeling Scanning Probe Microscopes (SPM) lab is designed to show students the principles of how a Scanning Probe Microscope works and how mapping on a smaller scale provides a more detailed view of a surface. Students will use a conductivity apparatus to model the mapping behavior of an...
Introduction to X-ray Microscopy (XRM): Technology and Applications for Lab-based Non-destructive, High-resolution 3D Imaging and Analysis
09 Aug 2019 | | Contributor(s):: John Kelley
This talk will cover an overview of XRM technology as well as prominent examples and applications.
X-Ray Micro-Computed Tomography Characterization of the Internal Microstructure of 3D Printed Hardened Cement-based Materials
09 Aug 2019 | | Contributor(s):: Mohamadreza Moini
In our research a lab-based X-ray microscope was used to perform micro-CT evaluations to explore the microstructural characteristics of 3-day old intact (i.e. not tested) 3D printed and cast hardened cement paste specimens at two levels of magnification: 0.4X and 4X. ...
ME 598: Nanoscale Fabrication & Characterization
27 Jun 2019 | | Contributor(s):: Sungwoo Nam
This course will provide a practical understanding of state-of-the-art nanoscale fabrication and characterization, and the fundamental principles behind these advanced techniques.
Sample Preparation for Powder X-ray Diffraction
13 Mar 2019 | | Contributor(s):: Nicole Wonderling, NACK Network
Critical Measurements to Enable the Use of Polymers in Membranes, Composites, and Impact Mitigation
05 Mar 2019 | | Contributor(s):: Christopher L. Soles
In this presentation I will present an overview of my research groups activities in these three areas, highlighting the importance of polymer structure and dynamics in establishing the functional properties of the polymers that enable the technology. For the sake of this presentation, I...
SEM Image Processing Tool
02 Oct 2018 | | Contributor(s):: Joshua A Schiller, Matthew Glen Robertson, Kristina M Miller, Kevin James Cruse, Kevin Liu, Darren K Adams, Benjamin Galewsky, Elif Ertekin, Sameh H Tawfick
Analysis and feature detection in SEM images of Graphene.
X-Ray Photoelectron Spectroscopy (XPS)
18 Sep 2018 | | Contributor(s):: Hamed Simchi, NACK Network
OutlineBasic principlesInstrumentationPeak characteristicsQuantitative analysisDepth profiling
Basic Characterization Techniques
24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlineIntroductionOptical MicroscopesProfilometryEllipsometryReflective SpectroscopyContact Angle
NACK Unit 6: Basic Characterization Techniques
19 Jul 2018 | | Contributor(s):: NACK Network
This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance.
Kaustubh Shriram Kulkarni
Lab Exercise: Ellipsometry
18 Jan 2017 | | Contributor(s):: NACK Network
The objective of this lab is to evaluate the ellipsometer. Multiple ellipsometers will be presented and compared. The procedural operation and working mechanisms of the ellipsometer will both be discussed.
Synthesis and Characterization of CdSe Qunatum Dots
11 Jan 2017 | | Contributor(s):: Nicholas Blake, NNCI Nano
In this laboratory, students will study how surfactant-based chemistry can be used to synthesize CdSe quantum dots and study how the size of the quantum dots can be controlled by varying reaction time. The laboratory will demonstrate how the color of these quantum dots can be connected to...
Silver Nanoparticle Synthesis, Spectroscopy, and Bacterial Growth
11 Jan 2017 | | Contributor(s):: Pennsylvania State University, NNCI Nano
Students will learn about the differences in physical propoerties at the nanoscale as compared to the same materials at the macroscale. The students will demonstrate the appropriate use of a spectrophotometer and will convert between different units of measurement. This unit assists students in...
Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...