Tags: electron microscopy

Description

An electron microscope is a type of microscope that produces an electronically-magnified image of a specimen for detailed observation. The electron microscope uses a particle beam of electrons to illuminate the specimen and create a magnified image of it. The microscope has a greater resolving power than a light-powered optical microscope, because it uses electrons that have wavelengths about 100,000 times shorter than visible light (photons), and can achieve magnifications of up to 2,000,000x, whereas light microscopes are limited to 2000x magnification.

Learn more about quantum dots from the many resources on this site, listed below. More information on Electron microscopy can be found here.

Resources (1-20 of 57)

  1. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    10 May 2007 | | Contributor(s):: Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  2. Characterization - Scanning Electron Microscopy

    11 Jan 2022 | | Contributor(s):: Atilla Ozgur Cakmak, NACK Network

  3. ECET 499N Lecture 8: Electron Microscopy

    02 Mar 2010 | | Contributor(s):: Eric Stach

    Guest lecture: Eric A. Stach

  4. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  5. Electron Microscopy

    24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlineScanning Electron MicroscopyField Emission Scanning Electron MicroscopyTransmission Electron MicroscopyEnergy Dispersive Spectroscopy

  6. Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films

    02 Feb 2012 | | Contributor(s):: Brian Demczyk

    In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.

  7. Fundamentals of Metrology and Characterization for Nanotechnology

    13 Mar 2019 | | Contributor(s):: Diane Hickey-Davis, NACK Network

    Outline:How do we see what we can’t see?Five common nanotech instrumentsFor each, I’ll cover:What it doesHow it worksWhere it’s used in IndustryWhat subjects you can teach with itWhat skills your students can learn from it

  8. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

    18 Feb 2010 | | Contributor(s):: Klaus Schulten

  9. IMOD online

    09 Jun 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Benjamin P Haley, Volkan Ortalan

    Online IMOD tool for electron tomography

  10. Introduction to Field Emission Scanning Electron Microscopy (FESEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  11. Introduction to Scanning Electron Microscopy (SEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  12. Lecture 11: FIONA (Fluorescence Imaging with One Nanometer Accuracy)

    11 Apr 2008 | | Contributor(s):: Paul R Selvin

    Fluorescence Imaging with One Nanometer Accuracy, Specificity to look at heads Nanometer spatial localization, Second temporal resolution, Single Molecule sensitivity Single Molecule Photostability

  13. Lecture 8: Resolutions

    07 Apr 2008 | | Contributor(s):: Paul R Selvin

    X-ray diffraction (atomic resolution)Electron (Imaging) Microscopy (nm-scale)Visible (Imaging) Microscopy (nm - µm)

  14. Lecture 9: X-ray Structure and FIONA

    07 Apr 2008 | | Contributor(s):: Paul R Selvin

    Accuracy vs. Resolution Measuring atomic distances Biomolecular Motors: Intra- AND Extra-Cellular Motion

  15. Like Driving a Car: Acquiring Quality SEM/FESEM Images in Different Situations

    19 Oct 2022 | | Contributor(s):: Bangzhi Liu, NACK Network

    Getting good SEM/FESEM images is dependent on both the sample conditions (conductivity, bulk vs. thin film, etc) and the instrument’s imaging parameters (e.g., beam voltage, beam current, working distance, detector, etc).  This webinar will simplify and explain the complex nature...

  16. Measurement of Twin Misorientation by use of First Order Laue Rings in CBED Patterns

    27 Jan 2012 | | Contributor(s):: Brian Demczyk, D. E. Laughlin

    This work describes a novel microdiffraction technique, utilizing a fine electron probe to gauge twin misorientation at the nanoscale.

  17. MSE 582 Lecture 10: Diffraction Contrast Imaging

    13 Feb 2008 | | Contributor(s):: Eric Stach

  18. MSE 582 Lecture 11: Overview of High-Resolution TEM & Scanning TEM

    14 Feb 2008 | | Contributor(s):: Eric Stach

  19. MSE 582 Lecture 12: Analytical Electron Microscopy

    15 Feb 2008 | | Contributor(s):: Eric Stach

  20. MSE 582 Lecture 1: Introduction

    28 Jan 2008 | | Contributor(s):: Eric Stach