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SCALE Radiation Testing of System-On-Chip (SoC) Devices
Online Presentations | 29 Jul 2024 | Contributor(s):: Mike Wirthlin
This presentation introduces system on chip (SoC) architectures and discusses the challenges of testing these architectures in radiation environments. The importance of run time SoC data extraction, preserving memory integrity, and testing multiple components simultaneously is discussed. ...
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SCALE From Electronics Testing to Radiation Testing: A Discussion
Online Presentations | 22 Mar 2024 | Contributor(s):: Michael Alles, Steven Bibyk, Will Ebel, Andrew L. Sternberg
A discussion on teaching electronics testing in the lab.
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Radiation Enabled Model Development and Validation
Online Presentations | 08 Mar 2024 | Contributor(s):: Jeffrey S. Kauppila
This lecture will discuss techniques and methods for modeling single-event radiation effects at the transistor and circuit level. The lecture will also cover topics related to the validation of models using test data from custom on-chip measurement techniques developed over the last decade.
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SCALE Total Ionizing Dose Response Mechanisms in a 12-nm FinFET Technology
Online Presentations | 21 Feb 2024 | Contributor(s):: Hugh Barnaby
This talk was also presented at the 2024 Microelectronics Reliability and Qualification Workshop, The Aerospace Corporation, El Segundo, CA, February, 6, 2024.
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Radiation Testing of Edge Processors for DAVINCI, A NASA Mission to Venus
Online Presentations | 09 Jan 2024
This lecture will discuss the NASA DAVINCI mission and the results from radiation testing of an emerging class of microprocessors (Tensor Processing Units (TPUs) and Vision Processing Units (VPU)) designed to enable edge computing and artificial intelligence (AI) applications, under...
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SCALE SEE Testing at TAMU for Future Development of the Lab RaTTS Project
Online Presentations | 03 Jan 2024 | Contributor(s):: Ryan Dempsey, Adrian Skudrinja
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Introduction to Radiation Testing
Online Presentations | 19 Sep 2023 | Contributor(s):: Michael Alles
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SCALE Work in Scale (ASU) LM117 Temperature Independent Voltage Regulator
Online Presentations | 19 Sep 2023 | Contributor(s):: Payton Philip Muscat
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SCALE Ion-Induced Stuck Bits in 5 nm Bulk FinFET SRAMs at High Fluences
Online Presentations | 19 Sep 2023 | Contributor(s):: Yoni Xiong
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SCALE Summer 2023 Research (ASU)
Online Presentations | 19 Sep 2023 | Contributor(s):: Esteban Chacon