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Schred

By Dragica Vasileska¹, Shaikh S. Ahmed², Matteo Mannino³, Gerhard Klimeck³, Gokula Kannan¹, Mark Lundstrom³, Akira Matsudaira⁴

1. Arizona State University 2. Southern Illinois University Carbondale 3. Purdue University 4. University of Illinois at Urbana-Champaign

SCHRED simulation software calculates the envelope wavefunctions and the corresponding bound-state energies in a typical MOS, SOS and a typical SOI structure.

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Version 2.4 - published on 26 Oct 2011

DOI: 10254/nanohub-r221.5 cite this

This tool is closed source.

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Category	Tools
Abstract	Schred calculates the envelope wavefunctions and the corresponding bound-state energies in a typical MOS (Metal-Oxide-Semiconductor) or SOS (Semiconductor-Oxide-Semiconductor) structure and a typical SOI (semiconductor-Oxide_Insulator) structure by solving self-consistently the one-dimensional (1D) Poisson equation and the 1D Schrodinger equation. Detailed Description Size Quantization Effects and Need for SCHRED SCHRED User Manual (with Rappture Interface) SCHRED Tutorial (for command-line operation) To better understand the operation of SCHRED tool and the physics of MOS capacitors please refer to: MOS Capacitors Operation Description How Quantum-Mechanical Space-Quantization is Implemented in SCHRED, Drift-Diffusion (SILVACO ATLAS) and Particle-Based Device Simulators (Quamc2D) SCHRED - Exercise 1 SCHRED - Exercise 2 SCHRED - Exercise 3 The source code of Schred has been attached as a file name "src.zip" and can be found under the Supporting Documents tab.
Publications	Gokula Kannan, Dragica Vasileska, “Schred V2.0 - Tool to model MOS Capacitors”, 14th International Workshop on Computational Electronics (IWCE), pp.1-4, Dec. 2010
Cite this work	Researchers should cite this work as follows: D. Vasileska, D. K. Schroder and D.K. Ferry, “Scaled silicon MOSFET’s: Part II - Degradation of the total gate capacitance”, IEEE Trans. Electron Devices 44, 584-7 (1997). Dragica Vasileska; Shaikh S. Ahmed; Matteo Mannino; Gerhard Klimeck; Gokula Kannan; Mark Lundstrom; Akira Matsudaira; Junzhe Geng (2011), "Schred," DOI: 10254/nanohub-r221.5. (DOI: 10254/nanohub-r221.5). BibTex \| EndNote
Tags	ACUTE AQME microelectronics MOS nanoelectronics nanotransistors open source tool quantum

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