Support Options

Submit a Support Ticket



By Dragica Vasileska1, Shaikh S. Ahmed2, Gokula Kannan1, Matteo Mannino3, Gerhard Klimeck3, Mark Lundstrom3, Akira Matsudaira4, Junzhe Geng3

1. Arizona State University 2. Southern Illinois University Carbondale 3. Purdue University 4. University of Illinois at Urbana-Champaign

SCHRED simulation software calculates the envelope wavefunctions and the corresponding bound-state energies in a typical MOS, SOS and a typical SOI structure.

Launch Tool

You must login before you can run this tool.

Version 2.54 - published on 04 Aug 2014

doi:10.4231/D3RV0D17C cite this

This tool is closed source.

View All Supporting Documents



Published on


Schred calculates the envelope wavefunctions and the corresponding bound-state energies in a typical MOS (Metal-Oxide-Semiconductor) or SOS (Semiconductor-Oxide-Semiconductor) structure and a typical SOI (semiconductor-Oxide_Insulator) structure by solving self-consistently the one-dimensional (1D) Poisson equation and the 1D Schrodinger equation. To better understand the operation of SCHRED tool and the physics of MOS capacitors please refer to:
  • MOS Capacitors Operation Description
  • How Quantum-Mechanical Space-Quantization is Implemented in SCHRED, Drift-Diffusion (SILVACO ATLAS) and Particle-Based Device Simulators (Quamc2D)
  • SCHRED - Exercise 1
  • SCHRED - Exercise 2
  • SCHRED - Exercise 3
  • The source code of Schred has been attached as a file name "" and can be found under the Supporting Documents tab.


    Gokula Kannan, Dragica Vasileska, “Schred V2.0 - Tool to model MOS Capacitors”, 14th International Workshop on Computational Electronics (IWCE), pp.1-4, Dec. 2010

    Cite this work

    Researchers should cite this work as follows:

    • D. Vasileska, D. K. Schroder and D.K. Ferry, “Scaled silicon MOSFET’s: Part II - Degradation of the total gate capacitance”, IEEE Trans. Electron Devices 44, 584-7 (1997).

    • Dragica Vasileska; Shaikh S. Ahmed; Gokula Kannan; Matteo Mannino; Gerhard Klimeck; Mark Lundstrom; Akira Matsudaira; Junzhe Geng (2014), "Schred," (DOI: 10.4231/D3RV0D17C).

      BibTex | EndNote

    Tags, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.