Tags: reliability

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  1. Experiences with nonintrusive polynomial Chaos and stochastic collocation methods for uncertainty analysis and design

    13 Mar 2009 | | Contributor(s):: Michael S. Eldred

    Non—intrusive polynomial chaos expansion (PCE) and stochastic collocation (SC) methods are attractive techniques for uncertainty quantification due to their abilities to produce functional representations of stochastic variability and to achieve exponential convergence rates in statistics of...

  2. ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET

    14 Nov 2008 | | Contributor(s):: Muhammad A. Alam

    Guest lecturer: Muhammad A. Alam.

  3. PRISM Seminar Series

    05 Nov 2008 | | Contributor(s):: Jayathi Murthy, Alejandro Strachan

    Welcome to the PRISM Seminar Series.PRIMS: NNSA Center for Prediction of Reliability, Integrity and Survivability of Microsystems, is a university center funded by the Department of Energy's National Nuclear Security Administration (NNSA) under their Advanced Simulation and Computing (ASC)...

  4. From density functional theory to defect level in silicon: Does the “band gap problem” matter?

    01 Oct 2008 | | Contributor(s):: Peter A. Schultz

    Modeling the electrical effects of radiation damage in semiconductor devices requires a detailed description of the properties of point defects generated during and subsequent to irradiation. Such modeling requires physical parameters, such as defect electronic levels, to describe carrier...

  5. Reliability Physics of Nanoscale Transistors

    27 Nov 2007 | | Contributor(s):: Muhammad A. Alam

    This course is now offered on nanoHUB as ECE 695A Reliability Physics of Nanotransistors.

  6. Modeling Interface-defect Generation (MIG)

    18 Jul 2006 | | Contributor(s):: Ahmad Ehteshamul Islam, HALDUN KUFLUOGLU, Muhammad A. Alam

    Analyzes device reliability based on NBTI