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nanoHUB-U: Thermal Resistance in Electronic Devices

This short course gives an introduction to the fundamentals of device heating, to simple methods for estimating the device temperature during operation, and to temperature measurement methods. The four short lectures are just 15-25 min each, can be taken together or independently, and are designed to bring students and engineers up to speed quickly.

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Course Description:

All nanoscale electronics -- such as transistors, interconnects, and memory -- heat up during operation and during measurement. This short course gives an introduction to the fundamentals of device heating, to simple methods for estimating the device temperature during operation, and to temperature measurement methods. The four short lectures are just 15-25 min each, can be taken together or independently, and are designed to bring students and engineers up to speed quickly. Further reading is provided with each lecture, and a set of practice exercises is suggested at the end.

Prerequisites:

Basic knowledge of semiconductor devices.

Course Outline:

Part 1: Basics of Joule Heating
Part 2: Heating in Devices & Circuits
Part 3: Thermal Resistance & Estimates
Part 4: Device Thermometry

Thermal Resistance in Electronic Devices first published on nanoHUB-U, April 2016.

Enrolled:	520
Course length:	1 week
Estimated Effort:	2 - 8 hours

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About the Instructor

Eric Pop

Stanford University

Prof. Eric Pop joined the Electrical Engineering (EE) faculty at Stanford in July 2013. Previously he was with the University of Illinois Urbana-Champaign, first as an Assistant Professor (2007-12) and then as an Associate Professor with tenure (2012-13). His research interests are in energy efficient electronics, novel 2-D and 1-D devices and materials, nanoscale energy conversion and harvesting. He received his Ph.D. in EE from Stanford (2005), M.Eng./B.S. in EE and B.S. in Physics from MIT (1999). Between 2005-2007, he did post-doctoral work at Stanford, then worked at Intel on nonvolatile memory. His awards include the 2010 Presidential (PECASE) award from the White House, the highest honor given by the US government to Early-Career Scientists and Engineers. He is also a recipient of the ONR Young Investigator Award (2010), the NSF CAREER Award (2010), the AFOSR Young Investigator Award (2010), the DARPA Young Faculty Award (2008), the Arnold O. Beckman Research Award (2007), several best paper/poster and teaching/advising awards. He is presently the Technical Program Chair for the IEEE Device Research Conference (DRC), and has served on program committees of the IEDM, APS, ISDRS, and Nano-DDS conferences. He is an IEEE Senior member, and a member of MRS, APS and AAAS.