MIT TFET compact model including the impacts of non-idealities 1.0.0
We present a compact model for tunnel FET that for the first time fits experimental transfer and output characteristics including the impact of non-idealities such as trap assisted tunneling and intrinsic band steepness.
Listed in Compact Models
Additional materials available
Version 1.0.0 - published on 07 May 2017 doi:10.4231/D3XW47X6W - cite this
Licensed under NEEDS Modified CMC License according to these terms
Supporting Docs
- MIT TFET compact model including the impacts of non-idealities 1.0.0 Verilog-A(ZIP | 7 KB)
- MIT TFET compact model including the impacts of non-idealities 1.0.0 Benchmarks(ZIP | 87 MB)
- MIT TFET compact model including the impacts of non-idealities 1.0.0 Parameters(PDF | 126 KB)
- MIT TFET compact model including the impacts of non-idealities 1.0.0 Experimental Data(ZIP | 1 KB)
- MIT TFET compact model including the impacts of non-idealities 1.0.0 Manual(PDF | 2 MB)
- LICENSE.txt(TXT | 2 KB)
- README.txt(TXT | 3 KB)