MIT TFET compact model including the impacts of non-idealities

Name: MIT TFET compact model including the impacts of non-idealities
Published: 2017-05-03
License: NEEDS Modified CMC License

Redwan Noor Sajjad; Ujwal Radhakrishna; Dimitri Antoniadis

doi:10.4231/D3XW47X6W

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MIT TFET compact model including the impacts of non-idealities 1.0.0

By Redwan Noor Sajjad¹, Ujwal Radhakrishna², Dimitri Antoniadis¹

1. Massachusetts Institute of Technology 2. Massachusetts Institute of Technology (MIT)

We present a compact model for tunnel FET that for the first time fits experimental transfer and output characteristics including the impact of non-idealities such as trap assisted tunneling and intrinsic band steepness.

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Version 1.0.0 - published on 07 May 2017 doi:10.4231/D3XW47X6W - cite this

Licensed under NEEDS Modified CMC License according to these terms

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