ECE 695A Lecture 25: Theory of Soft and Hard Breakdown

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Outline:

  • Oxide breakdowns need not be catastrophic
  • Observations about soft vs. hard breakdown
  • A simple model for soft/hard breakdown
  • Interpretation of experiments
  • Conclusions

Cite this work

Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 25: Theory of Soft and Hard Breakdown," https://nanohub.org/resources/17295.

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Time

Location

EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. dielectric breakdown
  3. nanoelectronics
  4. reliability
ECE 695A Lecture 25: Theory of Soft and Hard Breakdown
  • Lecture 25: Theory of Soft and Hard Breakdown 1. Lecture 25: Theory of Soft and… 0
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  • copyright 2013 2. copyright 2013 62.395729062395731
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  • Outline 3. Outline 63.096429763096431
    00:00/00:00
  • PMOS Reliability with SBD 4. PMOS Reliability with SBD 142.40907574240907
    00:00/00:00
  • Soft breakdown for PMOS 5. Soft breakdown for PMOS 277.54421087754423
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  • Hard Dielectric Breakdown 6. Hard Dielectric Breakdown 361.06106106106108
    00:00/00:00
  • Soft vs. hard breakdown 7. Soft vs. hard breakdown 482.28228228228232
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  • Transistors after Soft Breakdown 8. Transistors after Soft Breakdo… 574.44110777444109
    00:00/00:00
  • Changes in the off-current insignificant 9. Changes in the off-current ins… 665.26526526526527
    00:00/00:00
  • Drain and Gate Noise 10. Drain and Gate Noise 754.72138805472139
    00:00/00:00
  • Threshold Voltage: Small at All Positions 11. Threshold Voltage: Small at Al… 863.09642976309647
    00:00/00:00
  • Outline 12. Outline 992.32565899232566
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  • Const. Voltage vs. Const. Current Stress 13. Const. Voltage vs. Const. Curr… 1015.281948615282
    00:00/00:00
  • Softer Breakdown for Thinner Oxides 14. Softer Breakdown for Thinner O… 1225.8258258258259
    00:00/00:00
  • Softer breakdown for lower stress 15. Softer breakdown for lower str… 1455.6222889556223
    00:00/00:00
  • Softer with larger area, but less probable 16. Softer with larger area, but l… 1583.5835835835837
    00:00/00:00
  • Const V: Softer BD at Reduced Voltage 17. Const V: Softer BD at Reduced … 1674.6413079746415
    00:00/00:00
  • Softer Breakdown for Constant Current 18. Softer Breakdown for Constant … 1833.833833833834
    00:00/00:00
  • Outline 19. Outline 1906.74007340674
    00:00/00:00
  • A Simple Model for SBD and HBD 20. A Simple Model for SBD and HBD 1926.7267267267268
    00:00/00:00
  • Area Independent breakdown Current 21. Area Independent breakdown Cur… 2169.5028361695031
    00:00/00:00
  • A Simple Model for SBD and HBD 22. A Simple Model for SBD and HBD 2215.6489823156489
    00:00/00:00
  • Configuration and Conductance 23. Configuration and Conductance 2316.9169169169172
    00:00/00:00
  • Statistical Distribution of Perc. Resistance 24. Statistical Distribution of Pe… 2455.121788455122
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  • Gp is known, how to Determine PTHER ? 25. Gp is known, how to Determine … 2616.64998331665
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  • Is there a Thermal Threshold ? 26. Is there a Thermal Threshold ? 2785.7524190857525
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  • PTHER from Stress Current Dependence 27. PTHER from Stress Current Depe… 2863.9973306639972
    00:00/00:00
  • Breakdown always soft at 1.0V 28. Breakdown always soft at 1.0V 3006.74007340674
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  • Outline 29. Outline 3077.9779779779783
    00:00/00:00
  • Soft Breakdown at Reduced Voltage 30. Soft Breakdown at Reduced Volt… 3089.4227560894228
    00:00/00:00
  • Theory Interpreted: Stress Current 31. Theory Interpreted: Stress Cur… 3117.7510844177514
    00:00/00:00
  • Conclusions 32. Conclusions 3267.2672672672675
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  • References 33. References 3383.0163496830164
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