ECE 695A Lecture 31R: Review Questions

By Muhammad Alam

Electrical and Computer Engineering, Purdue University, West Lafayette, IN

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Abstract

Review Questions:

  1. What is the difference between parametric estimation vs. non-parametric estimation?
  2. What principle did Tacho Brahe’s approach assume?
  3. What is the difference between population and sample? When we collect data for TDDB or NBTI, what type of data are we collecting?
  4. What problem does Hazen formula avoid regarding Fi=i/n? How is this justified?
  5. What is the problem of Hazen formula with respect to censored data?
  6. Can you think of a situation where data censoring may be necessary for NBTI test?
  7. What is the difference between an outlier vs. a censored data?
  8. Do I need to know what the physical distribution is before using Hazen or Kaplan formula? Why or why not?

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Researchers should cite this work as follows:

  • Muhammad Alam (2013), "ECE 695A Lecture 31R: Review Questions," https://nanohub.org/resources/17584.

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EE 226, Purdue University, West Lafayette, IN

Tags

  1. course lecture
  2. nanoelectronics
  3. reliability