Scanning Electron Microscope

By John C. Bean

University of Virginia, Charlottesville, VA

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Category

Animations

Published on

Abstract

This resource describes a scanning electron microscope (SEM). It includes detailed depictions of how the electron beam is focused and used to create hugely magnified images of experimental specimens.

Credits

John Bean, University of Virginia
Virtual Science Lab

Cite this work

Researchers should cite this work as follows:

  • John C. Bean (2005), "Scanning Electron Microscope," https://nanohub.org/resources/446.

    BibTex | EndNote

Tags

  1. experiments
  2. instruments
  3. K-12
  4. materials science
  5. NCN Group - Characterization and Metrology