Tags: NCN Group - Characterization and Metrology

Description

Education group: Characterization and Metrology.

Characterization and Metrology.

All Categories (1-20 of 41)

  1. Introduction to X-ray Microscopy (XRM): Technology and Applications for Lab-based Non-destructive, High-resolution 3D Imaging and Analysis

    09 Aug 2019 | | Contributor(s):: John Kelley

    This talk will cover an overview of XRM technology as well as prominent examples and applications.

  2. Surface Characterization at Nanoscale by means of AFM L1.1: Introduction and “Getting in Contact”

    11 Nov 2018 | | Contributor(s):: Stanislav Leesment

    NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 1.

  3. Surface Characterization at Nanoscale by means of AFM L1.2: Resonance Oscillatory Modes

    11 Nov 2018 | | Contributor(s):: Stanislav Leesment

    NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 2.

  4. Surface Characterization at Nanoscale by means of AFM L1.3: Non-Resonant Oscillatory HybriD Mode

    11 Nov 2018 | | Contributor(s):: Stanislav Leesment

    NT-MDT focuses on atomic force microscopes (AFM) and its combinations with ultrahigh resolution spectroscopy for nanotechnology and its applications. This is Part 3.

  5. Birck Nanomaterials Characterization Workshop

    11 Nov 2018 | | Contributor(s):: Neil R Dilley

    The aim of the workshop is to review the measurement techniques for both newcomers and existing users, see the instruments in action, and discuss cutting edge developments in both instrumentation and research.

  6. Microfabrication, Characterization and Sensor Development in the Industrial Space

    07 Nov 2018 | | Contributor(s):: Nithin Raghunathan

    The Birck Nanotechnology center offers a variety of capabilities especially in general microfabrication, electrical and physical characterization. With regards to microfabrication, the center features a variety of toolsets to enable fabrication of most devices from scratch to finish. These...

  7. Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM)

    13 Oct 2018 |

  8. Introduction to Field Emission Scanning Electron Microscopy (FESEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  9. Introduction to Scanning Electron Microscopy (SEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  10. Advanced Scanning Probe Microscopy I

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  11. Advanced Scanning Probe Microscopy II

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  12. Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-Scale

    01 Oct 2018 | | Contributor(s):: Wook Jun Nam, NACK Network

    OutlineFIB OverviewFIB OperationFIB Applications

  13. X-Ray Photoelectron Spectroscopy (XPS)

    18 Sep 2018 | | Contributor(s):: Hamed Simchi, NACK Network

    OutlineBasic principlesInstrumentationPeak characteristicsQuantitative analysisDepth profiling

  14. Basic Characterization Techniques

    24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlineIntroductionOptical MicroscopesProfilometryEllipsometryReflective SpectroscopyContact Angle

  15. NACK Unit 6: Basic Characterization Techniques

    19 Jul 2018 | | Contributor(s):: NACK Network

    This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance.

  16. Ultrafast Microscopy of Energy and Charge Transport

    21 Dec 2017 | | Contributor(s):: Libai Huang

    In my talk, I will focus on our recent progress on visualization of exciton and charge transport in  solar  cell materials.

  17. Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics

    08 Dec 2017 | | Contributor(s):: Roger Proksch

    In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...

  18. Charge Transport in Perovskite Solar Cells Visualized using Ultrafast Microscopy

    27 Nov 2017 | | Contributor(s):: Jordan Snaider

    Overcoming the Shockley-Queisser limit for solar cell efficiency is possible if hot carriers can be harvested before they reach thermal equilibrium with the surrounding lattice. To efficiently extract hot carriers, they need to migrate sufficiently long distances for collection at the...

  19. Novel EM Nanoscale Techniques

    27 Nov 2017 | | Contributor(s):: Brian Demczyk

    Describes unconventional use of conventional techniques (SAD,CBED, HREM and Fourier analysis) to elucidate hard-to-access structural information at the nano scale.

  20. Lab Exercise: Ellipsometry

    18 Jan 2017 | | Contributor(s):: NACK Network

    The objective of this lab is to evaluate the ellipsometer. Multiple ellipsometers will be presented and compared. The procedural operation and working mechanisms of the ellipsometer will both be discussed.