Education group: Characterization and Metrology.
Introduction to X-ray Microscopy (XRM): Technology and Applications for Lab-based Non-destructive, High-resolution 3D Imaging and Analysis
09 Aug 2019 | | Contributor(s):: John Kelley
This talk will cover an overview of XRM technology as well as prominent examples and applications.
Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM)
13 Oct 2018 |
Introduction to Field Emission Scanning Electron Microscopy (FESEM)
10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
Introduction to Scanning Electron Microscopy (SEM)
Advanced Scanning Probe Microscopy I
01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
Advanced Scanning Probe Microscopy II
OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
X-Ray Photoelectron Spectroscopy (XPS)
18 Sep 2018 | | Contributor(s):: Hamed Simchi, NACK Network
OutlineBasic principlesInstrumentationPeak characteristicsQuantitative analysisDepth profiling
Basic Characterization Techniques
24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlineIntroductionOptical MicroscopesProfilometryEllipsometryReflective SpectroscopyContact Angle
NACK Unit 6: Basic Characterization Techniques
19 Jul 2018 | | Contributor(s):: NACK Network
This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance.
Ultrafast Microscopy of Energy and Charge Transport
21 Dec 2017 | | Contributor(s):: Libai Huang
In my talk, I will focus on our recent progress on visualization of exciton and charge transport in solar cell materials.
Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics
08 Dec 2017 | | Contributor(s):: Roger Proksch
In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...
Charge Transport in Perovskite Solar Cells Visualized using Ultrafast Microscopy
27 Nov 2017 | | Contributor(s):: Jordan Snaider
Overcoming the Shockley-Queisser limit for solar cell efficiency is possible if hot carriers can be harvested before they reach thermal equilibrium with the surrounding lattice. To efficiently extract hot carriers, they need to migrate sufficiently long distances for collection at the electrodes....
Novel EM Nanoscale Techniques
27 Nov 2017 | | Contributor(s):: Brian Demczyk
Describes unconventional use of conventional techniques (SAD,CBED, HREM and Fourier analysis) to elucidate hard-to-access structural information at the nano scale.
Lab Exercise: Ellipsometry
18 Jan 2017 | | Contributor(s):: NACK Network
The objective of this lab is to evaluate the ellipsometer. Multiple ellipsometers will be presented and compared. The procedural operation and working mechanisms of the ellipsometer will both be discussed.
Lab Exercise: Profilometry
The objective of this online lab is to evaluate the profilometer. Multiple profilometers will be presented and compared.
04 Dec 2015 | | Contributor(s):: SHINE Project, SHINE Project
Lecture 4 in a series of lectures on nanotechnology from SHINE: Seattle's Hub for Industry-driven Nanotechnology Education.
AFM Metrology of Cellulose Nanocrystals
03 May 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner
This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.
MSE 640 Transmission Electron Microscopy and Crystalline Imperfections
out of 5 stars
25 Feb 2008 | | Contributor(s):: Eric Stach
MSE 582 Transmission Electron Microscopy Skills
28 Jan 2008 | | Contributor(s):: Eric Stach
Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.
nanoHUB-U: Fundamentals of Atomic Force Microscopy, Part 1: Fundamental Aspects of AFM
24 Jul 2013
A free two-part series of online courses covering the principles and practice of atomic force microscopy.