Tags: NCN Group - Characterization and Metrology

Description

Education group: Characterization and Metrology.

Characterization and Metrology.

All Categories (1-20 of 21)

  1. Introduction to X-ray Microscopy (XRM): Technology and Applications for Lab-based Non-destructive, High-resolution 3D Imaging and Analysis

    09 Aug 2019 | | Contributor(s):: John Kelley

    This talk will cover an overview of XRM technology as well as prominent examples and applications.

  2. Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM)

    13 Oct 2018 |

  3. Introduction to Field Emission Scanning Electron Microscopy (FESEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  4. Introduction to Scanning Electron Microscopy (SEM)

    10 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

  5. Advanced Scanning Probe Microscopy I

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  6. Advanced Scanning Probe Microscopy II

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: Can be viewed hereOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: This LectureCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  7. X-Ray Photoelectron Spectroscopy (XPS)

    18 Sep 2018 | | Contributor(s):: Hamed Simchi, NACK Network

    OutlineBasic principlesInstrumentationPeak characteristicsQuantitative analysisDepth profiling

  8. Basic Characterization Techniques

    24 Aug 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlineIntroductionOptical MicroscopesProfilometryEllipsometryReflective SpectroscopyContact Angle

  9. NACK Unit 6: Basic Characterization Techniques

    19 Jul 2018 | | Contributor(s):: NACK Network

  10. Ultrafast Microscopy of Energy and Charge Transport

    21 Dec 2017 | | Contributor(s):: Libai Huang

    In my talk, I will focus on our recent progress on visualization of exciton and charge transport in  solar  cell materials.

  11. Advances in Ambient and Liquid AFM - Nanoscale Structure and Dynamics

    08 Dec 2017 | | Contributor(s):: Roger Proksch

    In this talk, we will explore some recent results in observations of structure and dynamics in a variety of systems ranging from polymer dynamics in ambient conditions, 3D atomic resolution mapping of the structure of the solid-liquid interface, defect dynamics in crystal lattice and biologically...

  12. Charge Transport in Perovskite Solar Cells Visualized using Ultrafast Microscopy

    27 Nov 2017 | | Contributor(s):: Jordan Snaider

    Overcoming the Shockley-Queisser limit for solar cell efficiency is possible if hot carriers can be harvested before they reach thermal equilibrium with the surrounding lattice. To efficiently extract hot carriers, they need to migrate sufficiently long distances for collection at the electrodes....

  13. Novel EM Nanoscale Techniques

    27 Nov 2017 | | Contributor(s):: Brian Demczyk

    Describes unconventional use of conventional techniques (SAD,CBED, HREM and Fourier analysis) to elucidate hard-to-access structural information at the nano scale.

  14. Lab Exercise: Ellipsometry

    18 Jan 2017 | | Contributor(s):: NACK Network

    The objective of this lab is to evaluate the ellipsometer. Multiple ellipsometers will be presented and compared. The procedural operation and working mechanisms of the ellipsometer will both be discussed.

  15. Lab Exercise: Profilometry

    18 Jan 2017 | | Contributor(s):: NACK Network

    The objective of this online lab is to evaluate the profilometer. Multiple profilometers will be presented and compared.

  16. Nanotechnology Characterization

    04 Dec 2015 | | Contributor(s):: SHINE Project, SHINE Project

    Lecture 4 in a series of lectures on nanotechnology from SHINE: Seattle's Hub for Industry-driven Nanotechnology Education.

  17. AFM Metrology of Cellulose Nanocrystals

    03 May 2011 | | Contributor(s):: Robert J. Moon, Ryan Wagner

    This talk discusses the characterization of cellulose nanocrystals via atomic force microscopy.

  18. MSE 640 Transmission Electron Microscopy and Crystalline Imperfections

    25 Feb 2008 | | Contributor(s):: Eric Stach

  19. MSE 582 Transmission Electron Microscopy Skills

    28 Jan 2008 | | Contributor(s):: Eric Stach

    Practical introduction to the operation of transmission electron microscopes. Microscope design and function; imaging and diffraction modes and image content; instrument operation. Required of all students who use the TEM in their research.

  20. nanoHUB-U: Fundamentals of Atomic Force Microscopy, Part 1: Fundamental Aspects of AFM

    24 Jul 2013

    A free two-part series of online courses covering the principles and practice of atomic force microscopy.

    https://nanohub.org/courses/AFM1