Tags: Device Characterization

All Categories (1-20 of 29)

  1. Shailesh M. Keshkamat

    https://nanohub.org/members/216195

  2. Nikolaos Makris

    https://nanohub.org/members/160697

  3. Udoy Paul

    https://nanohub.org/members/68281

  4. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

    28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...

  5. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

    28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

  6. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)

    28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...

  7. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)

    28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

    This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner...

  8. Dhawal Dilip Mahajan

    https://nanohub.org/members/65429

  9. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

    11 May 2011 | | Contributor(s):: Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to...

  10. Tonio Buonassisi

    Tonio Buonassisi is author of over 110 journal, conference, and workshop articles focused on photovoltaics. He received his Ph.D. from the University of California, Berkeley in 2006, where he...

    https://nanohub.org/members/54157

  11. Kei May Lau

    Chair Professor of Electrical and Electronic Engineering at Hong Kong University of Science and TechnologyProfessor Kei May Lau received the B.S. and M.S. degrees in physics from the University of...

    https://nanohub.org/members/53046

  12. Keithley 4200-SCS Lecture 12: Ultra-fast I-V for Pulsed and Transient Characterization

    24 Jan 2011 | | Contributor(s):: Lee Stauffer

  13. Keithley 4200-SCS Lecture 01: Introduction - System Overview - DC I-V Source Measurement

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Introduction to Device Characterization -System Overview: System Architecture, Hardware Features and Software Features -Precision DC I-V Source-Measure Features and Concepts.

  14. Keithley 4200-SCS Lecture 02: Basics of Keithley Interactive Test Environment (KITE)

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  15. Keithley 4200-SCS Lecture 03: More KITE Setup and Features

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  16. Keithley 4200-SCS Lecture 04: Speed and Timing Considerations

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  17. Keithley 4200-SCS Lecture 05: Low Current and High Resistance Measurements

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  18. Keithley 4200-SCS Lecture 06: Troubleshooting

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  19. Keithley 4200-SCS Lecture 07: KCON Utility Overview

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

  20. Keithley 4200-SCS Lecture 08: 4210 CVU Instrument Module - Overview

    20 Jan 2011 | | Contributor(s):: Lee Stauffer

    Theory of Operation and Measurement Overview