Courses (1-2 of 2)

1. Device Characterization with the Keithley 4200-SCS

   20 Jan 2011 | | Contributor(s):: Lee Stauffer

   This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.

2. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

   28 Mar 2012 | | Contributor(s):: Souvik Mahapatra

   This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has become a very important reliability concern as the industry moved from thicker SiO2 to thinner SiON...