Device Characterization with the Keithley 4200-SCS
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Abstract
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.
The Keithley Model 4200-SCS Semiconductor Characterization System performs lab grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.
Bio
Lee Stauffer has been with Keithley Instruments for 22 years. In that time, he has filled roles in applications engineering, technology development and business development. His current role is Senior Staff Technologist for the Semiconductor Measurements Group. His undergrad work was in electrical engineering with graduate work in physics. Prior to joining Keithley, Lee started his career working with satellite communication systems, and then several years in semiconductor fabs, working in both equipment and product engineering. Currently, Lee is working on the new class of ultra-fast I-V measurements.
References
- Model 4200-SCS Semiconductor Characterization System product webpage
- Model 4210-CVU 1kHz - 10MHz Capacitance Voltage Measurement Unit product webpage
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Location
Birck Nanotechnology Center, Purdue University, West Lafayette, IN