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Colloquium on Graphene Physics and Devices
22 Sep 2009 | | Contributor(s):: Joerg Appenzeller, Supriyo Datta, Mark Lundstrom
This short course introduces students to graphene as a fascinating research topic as well as to develop their skill in problem solving using the tools and techniques of electronics from the bottom up.
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Device Characterization with the Keithley 4200-SCS
20 Jan 2011 | | Contributor(s):: Lee Stauffer
This training session is based on the Keithley 4200-SCS Semiconductor Characterization System. It is intended for beginning to intermediate users. It covers basic concepts, both of the instrument, as well as general measurement considerations.
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ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)
03 Sep 2009 | | Contributor(s):: Ron Reifenberger, Arvind Raman
A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.
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ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2010)
01 Sep 2010 | | Contributor(s):: Ron Reifenberger, Arvind Raman
Fall 2010 A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.