Tags: MOS capacitors

Description

The MOS capacitor consists of a Metal-Oxide-Semiconductor structure which has the semiconductor substrate with a thin oxide layer and a top metal contact, referred to as the gate. A second metal layer forms an Ohmic contact to the back of the semiconductor and is called the bulk contact.

Learn more about quantum dots from the many resources on this site, listed below. More information on MOS Capacitors can be found here.

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  1. n-type and p-type biasing regions for MOS capacitors

    01 Nov 2018 | Contributor(s):: lawrence normAN LEBLANC

    This short tutorial illustrates the majority and minority charge carrier distributions in an MOS capacitor under three different biasing conditions: Accumulation, Depletion, and Inversion, for both n- and p-type structures and provides a simple mnemonic for the order of the biasing regions on a...

  2. Liu Yongjie

    https://nanohub.org/members/81402

  3. Notes on the Solution of the Poisson-Boltzmann Equation for MOS Capacitors and MOSFETs, 2nd Edition

    24 Oct 2012 | | Contributor(s):: Mark Lundstrom, Xingshu Sun

    These notes are intended to complement the discussion on pp. 63 – 68 in Fundamentals of Modern VLSI Devices by Yuan Taur and Tak H. Ning [1]. (Another good reference is Semiconductor Device Fundamentals by R.F. Pierret [2].) The objective is to understand how to treat MOS electrostatics without...

  4. MOS-C VFB Calculation: Comparison of Theoretical and Simulation Values

    05 Feb 2012 | | Contributor(s):: Stella Quinones

    The flatband voltage is calulated based on device physics theory and is compared to the value determined from the simulation of a MOS-Capacitor using the MOSCap simulation tool on the nanoHUB.org website. By completing this exercise, the student is able to compare the mathematical model of the...

  5. MOS-C VFB Calculation: Comparison of Theoretical and Simulation Values (Instructor Copy)

    05 Feb 2012 | | Contributor(s):: Stella Quinones

    The flatband voltage is calulated based on device physics theory and is compared to the value determined from the simulation of a MOS-Capacitor using the MOSCap simulation tool on the nanoHUB.org website. By completing this exercise, the student is able to compare the mathematical model of the...

  6. SCHRED Exercise: MOS Capacitor Analysis

    20 Jul 2010 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    The objective of this exercise is to examine the influence of semiclassical and quantum-mechanical charge description on the low-frequency CV-curves. It also teaches one the influence of poly-gate depletion on the low-frequency CV-curves.

  7. Quantum Bound States Exercise

    16 Jun 2010 | | Contributor(s):: Gerhard Klimeck, Parijat Sengupta, Dragica Vasileska

    Exercise BackgroundQuantum-mechanical systems (structures, devices) can be separated into open systems and closed systems. Open systems are characterized with propagating or current carrying states. Closed (or bound) systems are described with localized wave-functions. One such system is a...

  8. CV profile with different oxide thickness

    20 Apr 2010 | | Contributor(s):: Saumitra Raj Mehrotra, Gerhard Klimeck

    C-V (or capacitance-voltage) profiling refers to a technique used for the characterization of semiconductor materials and devices. C-V testing is often used during the characterization process to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures.C-V measurements can...

  9. Illinois ECE 440 Solid State Electronic Devices, Lecture 31: MOS Capacitor

    02 Mar 2010 | | Contributor(s):: Eric Pop

  10. Illinois ECE 440 Solid State Electronic Devices, Lecture 33: MOS Capacitance

    02 Mar 2010 | | Contributor(s):: Eric Pop

  11. Illinois ECE 440: MOS Capacitor Homework

    28 Jan 2010 | | Contributor(s):: Mohamed Mohamed

    This homework covers Threshold Voltage, MOS Band Diagram, and MOS Capacitance-Voltage Analysis.

  12. Exercise for MOS Capacitors: CV curves and interface and Oxide Charges

    03 Aug 2009 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

    This exercise is designed to teach the students how the CV curves of an ideal MOS Capacitor change in the presence of oxide or interface charges.

  13. MOSCAP: Theoretical Exercise - High Frequency CV Curves

    07 Jul 2009 | | Contributor(s):: Dragica Vasileska

    One is required to sketch the high frequency CV curves for different MOS Capacitors configurations.

  14. Band Structure Lab Demonstration: Bulk Strain

    12 Jun 2009 | | Contributor(s):: Gerhard Klimeck

    This video shows an electronic structure calculation of bulk Si using Band Structure Lab. Several powerful features of this tool are demonstrated.

  15. MOSCap: First-Time User Guide

    30 Mar 2009 | | Contributor(s):: SungGeun Kim, Benjamin P Haley, Gerhard Klimeck

    This first-time user guide provides an introduction to MOSCap. The MOSCap tool simulates the one-dimensional (along the growth direction) electrostatics in typical single and dual-gate Metal-Oxide-Semiconductor device structures as a function of device size, geometry, oxide charge, temperature,...

  16. ECE 612 Lecture 3: MOS Capacitors

    09 Sep 2008 | | Contributor(s):: Mark Lundstrom

    Outline: 1) Short review,2) Gate voltage / surface potential relation,3) The flatbandvoltage,4) MOS capacitance vs. voltage, 5) Gate voltage and inversion layer charge.

  17. ABACUS - Assembly of Basic Applications for Coordinated Understanding of Semiconductors

    16 Jul 2008 | | Contributor(s):: Xufeng Wang, Dragica Vasileska, Gerhard Klimeck

    One-stop-shop for teaching semiconductor device education

  18. MOSCAP - Theoretical Exercises 3

    02 Aug 2008 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

  19. MOSCAP - Theoretical Exercises 2

    02 Aug 2008 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck

  20. MOSCAP - Theoretical Exercises 1

    02 Aug 2008 | | Contributor(s):: Dragica Vasileska, Gerhard Klimeck