Tags: X-Ray Photoelectron Spectroscopy (XPS)

Description

X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the physical and chemical properties of a material's surface. XPS uses a beam of X-rays to irradiate the material while simultaneously measuring the kinetic energy (KE) and the number of electrons that escape from within the top 10 to 12 nm of the material being analyzed. The resulting spetra of number of electrons vs. the kinetic energy is used to identify the elements present on the surface of the material being analyzed. For a more extensive description of XPS see WIkipedia.
 

Learn more about XPS from the resources on this site, listed below.

Resources (1-20 of 26)

  1. Introduction to X-ray Diffraction (XRD)

    Online Presentations | 02 Dec 2022 | Contributor(s):: Peter Kazarinoff, NACK Network

  2. X-ray Diffraction (XRD) Part 2

    Online Presentations | 18 Nov 2022 | Contributor(s):: Atilla Ozgur Cakmak, NACK Network

  3. World of Light

    Online Presentations | 22 Sep 2022 | Contributor(s):: Atilla Ozgur Cakmak, The Micro Nano Technology - Education Center

    In this presentation, World of Light, Atilla Ozgur Cakmak, Assistant Professor at Grand Valley State University, explains Photonics and more.

  4. Mystery Molecules: Identifying Materials with Nanoscale Characterization Tools

    Teaching Materials | 18 Mar 2020 | Contributor(s):: Maude Cuchiara, NNCI Nano

     In this lesson plan, students will be given several similar looking materials and asked to identify them by observing them at the macro and micro-scale. They will then be exposed to different analytical tools and describe how they can be used to explore materials at the nanoscale. ...

  5. X-Ray Photoelectron Spectroscopy (XPS)

    Online Presentations | 18 Sep 2018 | Contributor(s):: Hamed Simchi, NACK Network

    OutlineBasic principlesInstrumentationPeak characteristicsQuantitative analysisDepth profiling

  6. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    Online Presentations | 20 Jul 2018 | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

  7. Characterization of 2D materials at Birck Surface Analysis Facility

    Online Presentations | 28 Sep 2016 | Contributor(s):: Dmitry Zemlyanov

    Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...

  8. Nanotechnology for Aerospace Research: Surface Science Applications

    Online Presentations | 29 Mar 2016 | Contributor(s):: Dmitry Zemlyanov

    Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...

  9. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 1

    Online Presentations | 18 Aug 2015 | Contributor(s):: Rick Haasch

  10. [Illinois] X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) Part 2

    Online Presentations | 18 Aug 2015 | Contributor(s):: Rick Haasch

  11. Surface structure and composition of high-surface-area molybdenum nitrides

    Papers | 02 Feb 2012 | Contributor(s):: Brian Demczyk, j. G. Choi, L. T. Thompson

    In this work, we have employed high-resolutiontransmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy todetermine the near-surface structures and compositions of a series of molybdenum nitride catalysts.

  12. XPS Thickness Solver

    Tools | 18 Dec 2011 | Contributor(s):: Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin

    Helps the user to determine the thickness of an overlayer material from XPS experiment data.

  13. BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems

    Online Presentations | 10 Nov 2011 | Contributor(s):: James Leary

    See references below for related reading.14.1      Introduction to integrated designs14.1.1    “Total design” but there is some order in the design process14.1.2    A brief outline of the total design...

  14. BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications

    Online Presentations | 01 Nov 2011 | Contributor(s):: Dmitry Zemlyanov

    Guest lecturer: Dmitry Zemlyanov

  15. ECET 499N Lecture 9: XPS: X-ray Photoelectron Spectroscopy & ESCA: Electron Spectrometer for Chemical Analysis

    Online Presentations | 04 Mar 2010 | Contributor(s):: Dmitry Zemlyanov

    Guest Lecturer: Dmitry Zemlyanov

  16. Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG

    Online Presentations | 30 Jan 2010 | Contributor(s):: Dmitry Zemlyanov

    In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...

  17. Metal Oxide Nanowires as Gas Sensing Elements: from Basic Research to Real World Applications

    Online Presentations | 21 Sep 2009 | Contributor(s):: andrei kolmakov

    Quasi 1-D metal oxide single crystal chemiresistors are close to occupy their specific niche in the real world of solid state sensorics. Potentially, the major advantage of this kind of sensors with respect to available granular thin film sensors will be their size and stable, reproducible and...

  18. ECET 499N: Introduction to Nanotechnology

    Courses | 30 Mar 2009 | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  19. CNDO/INDO

    Tools | 09 Oct 2007 | Contributor(s):: Baudilio Tejerina, Jeff Reimers

    Semi-empirical Molecular Orbital calculations.

  20. X-ray Photoelectron Spectroscopy (XPS) Tour

    Online Presentations | 24 Jan 2008 | Contributor(s):: Dmitry Zemlyanov

    A guided tour, given by Dmitry Zemlyanov, of the X-ray Photoelectron Spectroscopy (XPS) lab located in the Birck Nanotechnology Center at Purdue University.