MIT TFET compact model including the impacts of non-idealities 1.0.0
We present a compact model for tunnel FET that for the first time fits experimental transfer and output characteristics including the impact of non-idealities such as trap assisted tunneling and intrinsic band steepness.
Listed in Compact Models
Additional materials available
Version 1.0.0 - published on 07 May 2017 doi:10.4231/D3XW47X6W - cite this
Licensed under NEEDS Modified CMC License according to these terms
Versions
Version | Released | DOI Handle | Status | |
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1.0.0 | May 03, 2017 | 10.4231/D3XW47X6W | published | view version » |