R3 2.0.0
Compact model for polysilicon (poly) resistors, 3-terminal JFETs, and diffused resistors.
Listed in Compact Models | publication by group NEEDS: New Era Electronic Devices and Systems
Additional materials available
Version 2.0.0 - published on 21 Nov 2014 doi:10.4231/D3QB9V64G - cite this
Licensed under NEEDS Modified CMC License according to these terms
Description
r3 is a compact model for polysilicon (poly) resistors, 3-terminal JFETs, and diffused resistors (which are really just JFETs, often with a large pinch-off voltage so they are fairly linear). Nonlinearity in poly resistors comes from self-heating and, to a lesser extent, from MOS action, where the potential difference between the resistor body and the semiconductor region underneath it modulates the conductivity of the body of the resistor. Nonlinearity in diffused resistors and JFETs also comes from self-neating and depletion region modulation with bias, although from pn-junction rather than MOS physics, and in addition from velocity saturation. r3 models all of these causes of nonlinearity, along with their geometry and temperature dependence, and also includes models for noise, statistical variation, parasitic capacitance, and parasitic leakage currents (which are primarily important for JFETs and diffused resistors).
Model Release Components ( Show bundle contents ) Bundle
- R3 2.0.0 Verilog-A(ZIP | 21 KB)
- R3 2.0.0 Benchmarks(ZIP | 96 KB)
- R3 2.0.0 Parameters(RTF | 292 KB)
- R3 2.0.0 Experimental Data(GZ | 446 KB)
- R3 2.0.0 Manual(ZIP | 210 KB)
- License terms
Cite this work
Researchers should cite this work as follows:
- McAndrew, C. (2014). R3. (Version 2.0.0). nanoHUB. doi:10.4231/D3QB9V64G
Tags
NEEDS: New Era Electronic Devices and Systems
This publication belongs to the NEEDS: New Era Electronic Devices and Systems group.