Support

Support Options

Submit a Support Ticket

 

Exercise: CV curves for MOS capacitors

By Dragica Vasileska1, Gerhard Klimeck2

1. Arizona State University 2. Purdue University

Download (PDF)

Licensed according to this deed.

Published on

Abstract

This exercise demonstrates to the students how the low-frequency CV curves in MOS capacitors change with changing the gate workfunction, the oxide thickness and the dielectric constant. It also demonstrates the doping variation of the high-frequency CV curves.

Credits

NSF

Sponsored by

NSF

Cite this work

Researchers should cite this work as follows:

  • Dragica Vasileska; Gerhard Klimeck (2008), "Exercise: CV curves for MOS capacitors," https://nanohub.org/resources/4855.

    BibTex | EndNote

Tags

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.