Tags: NEEDS node

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  1. [Poster] Multiphysics Modeling and Simulation in Berkeley MAPP

    Presentation Materials | 25 May 2016 | Contributor(s):: Tianshi Wang

  2. [Poster] NEEDS Platform and Recent Developments

    Presentation Materials | 25 May 2016 | Contributor(s):: Xufeng Wang

  3. [Poster] Physics–based Compact Model of Thermoelectric Devices

    Presentation Materials | 25 May 2016 | Contributor(s):: Xufeng Wang

  4. [Poster] RRAM Compact Modeling: Parameter Extraction and Array Optimization

    Presentation Materials | 25 May 2016 | Contributor(s):: Zizhen Jiang

  5. [Poster] Silicon optical modulator

    Presentation Materials | 25 May 2016 | Contributor(s):: Lily Weng

  6. [Poster] Simulation-ready Compact Modeling of Memristive Device

    Presentation Materials | 25 May 2016 | Contributor(s):: Tianshi Wang

  7. [Poster] Using the Model and Algorithm Prototyping Platform (MAPP) to generate a VHDL model of the microring resonator

    Presentation Materials | 25 May 2016 | Contributor(s):: Roman Shugayev

  8. [Poster] VAPP: The Berkeley Verilog-A Parser and Processor

    Presentation Materials | 25 May 2016 | Contributor(s):: A. Gokcen Mahmutoglu

  9. NEEDS: Goals, Status, and Plans

    Presentation Materials | 18 Mar 2016 | Contributor(s):: Mark Lundstrom

    This is the opening talk for 2016 MAPP workshop at U.C. Berkeley. It gives an overview of the NEEDS node in 2016.

  10. Too hot to handle? The emerging challenge of reliability/variability in self-heated FintFET, ETSOI, and GAA-FET

    Presentation Materials | 11 Jan 2016 | Contributor(s):: Muhammad A. Alam, Sang Hoon Shin, Muhammad Abdul Wahab, Jiangjiang Gu, Jingyun Zhang, Peide "Peter" Ye

    This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015. It is difficult to control the geometry, doping, and thicknesses of small transistors. Moreover, nanoscale transistors degrade due to NBTI and HCI at vastly different...

  11. MAPP: The Berkeley Model and Algorithm Prototyping Platform

    Presentation Materials | 11 Jan 2016 | Contributor(s):: Tianshi Wang, Aadithya V Karthik, Jaijeet Roychowdhury

    This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015. It provides an introduction to Berkeley Model and Algorithm Prototyping Platform (MAPP). MAPP is a MATLAB-based platform that provides a complete environment for developing, testing,...

  12. The NEEDS Initiative: Devices, Circuits, and Systems

    Presentation Materials | 07 Jan 2016 | Contributor(s):: Mark Lundstrom

    This presentation is part of the 8th IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) 2015.This presentation provides an overview of the NEEDS initiative, which is funded by the U.S. National Science Foundation and by the Semiconductor Research Corporation. The overarching...

  13. Advanced CMOS Device Physics for 7 nm and Beyond

    Presentation Materials | 16 Dec 2015 | Contributor(s):: Scott Thompson

    This presentation is part of 2015 IEDM tutorials The industry march along Moore's Law continues and new semiconductor nodes at 7 and beyond will certainly happen. However, many device, material, and economical challenges remain. This tutorial will target understanding key device concepts for...

  14. Emerging CMOS Technology at 5 nm and Beyond: Device Options and Trade-offs

    Presentation Materials | 14 Dec 2015 | Contributor(s):: Mark Lundstrom, Xingshu Sun, Dimitri Antoniadis, Shaloo Rakheja

    Device Options and Trade-offs

  15. MATLAB: Negative Capacitance (NC) FET Model

    Downloads | 05 Dec 2015 | Contributor(s):: Muhammad Abdul Wahab, Muhammad A. Alam

    MATLAB model that calculates the Q-V, C-V, and I-V characteristics of the conventional MOSFET and NC-FET.

  16. A Tutorial Introduction to Negative-­Capacitor Landau Transistors: Perspectives on the Road Ahead

    Online Presentations | 04 Dec 2015 | Contributor(s):: Muhammad A. Alam

    In this talk, I use a simple graphical approach to demystify the device and explain why the experimental results are easy to misinterpret. Since the NC-FET is just a special case of a much broader class of phase-change devices and systems (e.g., transistors, memories, MEMS, logic-in-memory...

  17. MVS Nanotransistor Model (Silicon)

    02 Dec 2015 | Compact Models | Contributor(s):

    By Shaloo Rakheja1, Dimitri Antoniadis1

    Massachusetts Institute of Technology (MIT)

    The MIT Virtual Source (MVS) model is a semi-empirical compact model for nanoscale transistors that accurately describes the physics of quasi-ballistic transistors with only a few physical parameters.

    https://nanohub.org/publications/15/?v=4

  18. MVS III-V HEMT model

    01 Dec 2015 | Compact Models | Contributor(s):

    By Shaloo Rakheja1, Dimitri Antoniadis1

    Massachusetts Institute of Technology (MIT)

    The MIT Virtual Source (MVS) model is a semi-empirical compact model for nanoscale transistors that accurately describes the physics of quasi-ballistic transistors with only a few physical...

    https://nanohub.org/publications/71/?v=1

  19. The Deployment and Evolution of the First NEEDS- Certified Model — MIT Virtual Source Compact Model for Silicon Nanotransistors

    Online Presentations | 04 Oct 2015 | Contributor(s):: Shaloo Rakheja

    In my talk, I will walk you through the fundamental steps involved in developing compact models, using the MVS model as an example. From the “lessons learned” in the process of MVS release in 2013 and its subsequent updates, I will provide a checklist of good practices to adopt while...

  20. VALint: the NEEDS Verilog-A Checker (BETA)

    Tools | 21 Jan 2015 | Contributor(s):: Xufeng Wang, Geoffrey Coram, Colin McAndrew

    Verilog-A lint and pretty printer created by NEEDS