Tags: reliability

Resources (61-80 of 108)

  1. ECE 695A Lecture 10A: Appendix - Reflection on R-D Equation

    Online Presentations | 08 Feb 2013 | Contributor(s):: Muhammad Alam

  2. ECE 695A Lecture 12: Field Dependence of NBTI

    Online Presentations | 08 Feb 2013 | Contributor(s):: Muhammad Alam

    Outline:Background: Field dependent degradationComponents of field-dependent dissociation:Interpreting experimentsVoltage acceleration factorsConclusion

  3. ECE 695A Lecture 11R: Review Questions

    Online Presentations | 08 Feb 2013 | Contributor(s):: Muhammad Alam

    Review Questions:Does Einstein relationship hold for activated diffusion?People argue that the forward dissociation and reverse passivation have similar activation barriers. Would you support the argument?What assumption did I make regarding diffusion of H in SiO2 that makes the derivation...

  4. ECE 695A Lecture 12R: Review Questions

    Online Presentations | 08 Feb 2013 | Contributor(s):: Muhammad Alam

    Review Questions:Explain the difference between local field and global field within an oxide. Explain physically why electric field decreases bond strength.How does the dissociation process becomes non-Arrhenius?Do you think the diffusion and repassivation will also become non-Arrhenius when...

  5. ECE 695A Lecture 9R: Review Questions

    Online Presentations | 08 Feb 2013 | Contributor(s):: Muhammad Alam

    Review Questions:Does NBTI power-exponent depend on voltage or temperature?Do you expect the NBTI power-exponent to be larger or smaller if trapping is important?How does one know that the diffusing species is neutral?How would the time-exponent different for a surround gate MOSFET vs. planar...

  6. ECE 695A Lecture 11: Temperature Dependence of NBTI

    Online Presentations | 07 Feb 2013 | Contributor(s):: Muhammad Alam

    Outline:Review: Temperature activation & NBTITemperature dependent forward/reverse ratesTemperature dependence of diffusion coefficientMaterial dependence of activation energyConclusion

  7. ECE 695A Lecture 10: NBTI Time Dependence -- Frequency and Duty Cycle Dependencies

    Online Presentations | 06 Feb 2013 | Contributor(s):: Muhammad Alam

    Outline:NBTI stress and relaxation by R-D modelFrequency independence and lifetime projectionDuty cycle dependenceThe magic of measurementConclusions

  8. ECE 695A Lecture 9: NBTI Time Dependence -- Stress Phase

    Online Presentations | 06 Feb 2013 | Contributor(s):: Muhammad Alam

    Outline:Background: Time-dependent degradationThe Reaction-Diffusion modelApproximate solution to R-D model in stress phaseDegradation free transistorsConclusions

  9. ECE 695A Lecture 6: Defects in the Bulk and at Interfaces

    Online Presentations | 01 Feb 2013 | Contributor(s):: Muhammad Alam

    Outline:Strain in materials/origin of defectsExamples: bulk defectsExamples: interface defectsMeasurementsConclusions

  10. ECE 695A Lecture 8: Phenomenological Observations for NBTI

    Online Presentations | 01 Feb 2013 | Contributor(s):: Muhammad Alam

    Outline:Qualitative observationsTime, voltage, temperature dependenciesMaterial dependenceCircuit implications

  11. ECE 695A Lecture 8R: Review Questions

    Online Presentations | 01 Feb 2013 | Contributor(s):: Muhammad Alam

    What is the distinction between BTI and NBTI phenomena?What does it mean that a process is thermally activated?What is the difference between parametric failure and catastrophic failure? Give examples. What are the time-characteristics of trapping, BTI, and NBTI?Which device will have poorer NBTI...

  12. ECE 695A Lecture 5: Amorphous Material/Interfaces

    Online Presentations | 29 Jan 2013 | Contributor(s):: Muhammad Alam

    Outline:Amorphous vs. crystalline materialsDefect-free amorphous materialOrigin of defects (Maxwell’s relation)Conclusions

  13. ECE 695A Lecture 7: Trapping in Pre-existing Traps

    Online Presentations | 29 Jan 2013 | Contributor(s):: Muhammad Alam

    Outline:Pre-existing vs. stress-induced trapsVoltage-shift in pre-existing bulk/interface trapsRandom Telegraph Noise, 1/f noiseConclusion

  14. ECE 695A Lecture 7A: Appendix - Theory of Stochastic Distribution

    Online Presentations | 29 Jan 2013 | Contributor(s):: Muhammad Alam

    Supplemental information for Lecture 7: Trapping in Pre-existing Traps

  15. ECE 695A Lecture 7R: Review Questions

    Online Presentations | 29 Jan 2013 | Contributor(s):: Muhammad Alam

    Review Questions:Why are there more types of defects in crystals than in amorphous material?From the perspective of Maxwell’s relation, how does H reduce defect density?Why is HfO2 so defective --- and why do you want to use it?Which type of traps involve faster trapping/detrapping, Pb center or...

  16. ECE 695A Lecture 3: Reliability as a Threshold Problem

    Online Presentations | 17 Jan 2013 | Contributor(s):: Muhammad Alam

    Outline:Reliability as a Threshold Problem: Empirical vs. Physical Models‘Blind Fish in a Waterfall’ as a prototype for Accelerated Testing/Statistical distributionFour elements of Physical ReliabilityConclusions

  17. ECE 695A Lecture 4: Structures and Defects in Crystals

    Online Presentations | 17 Jan 2013 | Contributor(s):: Muhammad Alam

    Outline:Background informationDefect-free crystal structuresDefects in crystalsConclusions

  18. ECE 695A Reliability Physics of Nanotransistors

    Courses | 17 Jan 2013 | Contributor(s):: Muhammad Alam

    This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, the students learn how to compute current through a device when a voltage is applied.

  19. ECE 695A Lecture 2: A Brief History of Reliability and Types of Reliability Models

    Online Presentations | 16 Jan 2013 | Contributor(s):: Muhammad Alam

    Outline:Reliability as a General PhenomenaA Brief History of ReliabilityApproaches to Reliability PhysicsConclusions

  20. ECE 695A Lecture 1: Reliability of Nanoelectronic Devices

    Online Presentations | 11 Jan 2013 | Contributor(s):: Muhammad Alam

    Outline:Evolving Landscape of ElectronicsPerformance, Variability, and ReliabilityClassification of ReliabilityCourse InformationConclusions