NACK Unit 6: Basic Characterization Techniques

Center for Nanotechnology Education and Utilization, Pennsylvania State University, State College, PA

This resource belongs to the NACK Network group.

Lecture Number/Topic	Online Lecture	Video	Lecture Notes
Touching, Seeing, Chemically Detecting, and Hearing at our Size Scale	View HTML	View	Notes (pdf) Notes (pptx)
The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale	View HTML	View	Notes (pdf) Notes (pptx)
Basic Characterization Techniques	View HTML	View	Notes (pdf) Notes (pptx)
Introduction to Scanning Electron Microscopy (SEM)	View HTML	View	Notes (pdf) Notes (pptx)
Electron Microscopy	View HTML	View	Notes (pdf) Notes (pptx)
Introduction to Field Emission Scanning Electron Microscopy (FESEM)		View
Focused Ion Beam (FIB): “Seeing” and “Processing” at the Nano-Scale	View HTML	View	Notes (pdf) Notes (pptx)
Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM)		View
Advanced Scanning Probe Microscopy I	View HTML	View	Notes (pdf)
Advanced Scanning Probe Microscopy II	View HTML	View	Notes (pdf)
Sample Preparation for Powder X-ray Diffraction		View
X-Ray Photoelectron Spectroscopy (XPS)	View HTML	View	Notes (pdf) Notes (pptx)
Secondary Ion Mass Spectrometry (SIMS)	View HTML	View	Notes (pdf) Notes (pptx)
Confocal Microscopy	View HTML	View	Notes (pdf) Notes (pptx)
Fundamentals of Metrology and Characterization for Nanotechnology	View HTML	View	Notes (pdf)